We are pleased to announce that the 3rd MacroScale conference will take place at the Centre for Metrology (MIKES) of the VTT Technical Research Centre of Finland in Espoo from 17th to 19th of October 2017. It will be jointly organized be VTT MIKES, PTB and EURAMET TC-L. In the tradition of the conference series "Recent Developments in Traceable Dimensional Measurements" and following the 1st and 2nd MacroScale conferences held in 2011 and 2014, respectively, the MacroScale 2017 conference intends to provide a forum for latest reports on current trends and developments in the field of traceable dimensional measuresments.
The MacroScale conference is devoted to the highest level of length measurements of objects ranging from several 100 µm to km and on their traceability to the definition of the Metre within the International System of Units (SI). Welcome are reports on progress in the development or application of instruments, principles, methods, algorithms, components, instruments and measurement procedures and in the determination of the related measurement uncertainties, as well as reports on regional or international measurement comparisons or the results of international projects related to the field. This is to be extended to the measurement of quantities that are required to determine the uncertainties of dimensional measurements, such as sample and air temperature or probing interaction.
Please submit abstracts by May, 13th 2017 electronically on the conference website at www.macroscale.org. The submission form is available, please login first.
The Abstract may contain Images or diagrams in colour, but may not exceed two pages. Accepted abstracts will be made electronically available on the website together with the conference program a few weeks before the conference.
Full papers will be published in a special issue of the scientific journal Measurement Science and Technology. These manuscripts will be peer reviewed by independent referees. Alternatively, full papers can be published on the MacroScale website which will be maintained on a long term.
- Interferometry (e.g. absolute range finding interferometry, imaging interferometry, displacement interferometry)
- Calibration of length standards (e.g. gauge blocks, line scales)
- Coordinate metrology (including multi-sensor systems, computed tomography, µCMMs and large scale CMMs)
- Vision based dimensional metrology
- Form measurements
- Surface texture measurements
- Tactile, optical and electronic sensors for displacement and structure localization
- Temperature and force measurements related to dimensional measurements
- Angle metrology
- Measurement uncertainty determination of dimensional measurements
The early registration fee will be 380€ (early bird rate) and will include proceedings, beverages, lunch, and the conference dinner. Payments made by bank transfer are preferred but payments made in cash at the registration desks are also possible. The fees will increase by 40€ one month before the conference. For the time being credit cards and checks cannot be accepted. The fee does not include the accommodation and travel.
Foreign visitors entering Finland must be in possession of a valid ID or passport. Delegates from countries requiring visas should apply the Finland consular offices or diplomatic missions in their home countries. Contributors requesting a letter of invitation to include with their visa application are required to register online for the conference first and then contact the organizer via email.