We are pleased to announce that the 4th MacroScale conference will take place at the CSIR International Convention Center (CSIR ICC) in Pretoria, South Africa from 17th to 18th of November 2020. It will be jointly organized by NMISA and PTB. In the tradition of the conference series "Recent Developments in Traceable Dimensional Measurements" and following MacroScale conferences held in 2011, 2014 and 2017, the MacroScale 2020 conference intends to provide a forum for latest reports on current trends and developments in the field of traceable dimensional measuresments.
The MacroScale conference is devoted to the highest level of length measurements of objects ranging from several 100 µm to km and on their traceability to the definition of the Metre within the International System of Units (SI). Welcome are reports on progress in the development or application of instruments, principles, methods, algorithms, components, instruments and measurement procedures and in the determination of the related measurement uncertainties, as well as reports on regional or international measurement comparisons or the results of international projects related to the field. This is to be extended to the measurement of quantities that are required to determine the uncertainties of dimensional measurements, such as sample and air temperature or probing interaction.
The Abstract may contain Images or diagrams in colour, but may not exceed two pages. Accepted abstracts will be made electronically available on the website together with the conference program a few weeks before the conference.
Contributions presented at MacroScale 2020 might be published by the authors individually in an appropriate peer reviewed scientific journal, e.g. Measurement Science and Technology or Metrologia, finally to be linked to the MacroScale website.
Alternatively, full papers can be published on the MacroScale website which will be maintained on a long term, including DOI assignment.
- Interferometry (e.g. absolute range finding interferometry, imaging interferometry, displacement interferometry)
- Calibration of length standards (e.g. gauge blocks, line scales)
- Coordinate metrology (including multi-sensor systems, computed tomography, µCMMs and large scale CMMs)
- Vision based dimensional metrology
- Form measurements
- Surface texture measurements
- Tactile, optical and electronic sensors for displacement and structure localization
- Temperature and force measurements related to dimensional measurements
- Angle metrology
- Measurement uncertainty determination of dimensional measurements
The early registration fee will be 350 € (early bird rate) and will include beverages, lunch, and the conference dinner. The early registration fee for full time students is 250 €. Payments made by bank transfer are preferred but payments made in cash at the registration desks are also possible. The fees will increase by 50 € one month before the conference. For the time being credit cards and checks cannot be accepted. The fee does not include the accommodation and travel.
Foreign visitors entering South Africa must be in possession of a valid ID or passport. Delegates from countries requiring visas should apply the South Africa consular offices or diplomatic missions in their home countries. Contributors requesting a letter of invitation to include with their visa application are required to register online for the conference first and then contact the organizer via email.
How to get there:
CSIR International Convention Centre (CSIR ICC) https://www.csiricc.co.za/visitors/map-directions/
The conference will be jointly organized by NMISA and PTB
Contacts: Faith Hungwe, email@example.com
Oelof Kruger, firstname.lastname@example.org
René Schödel, email@example.com